Electron microscopy is a technique that employs accelerated electrons to image, as the wavelength of electrons is much smaller than visible light (photons) the resolving power
(magnification) can be much higher measurements to the nanometre scale, including nanoparticles and nanotubes.
Advanced microscopy techniques such as SEM (Scanning Electron Microscopy), TEM (Transmission Electron Microscopy) and Dual Beam SEM are essential techniques to investigate sample
microstructure, morphology, composition and defects. These techniques often employ elemental mapping capabilities such as EELS (Electron Energy Loss Spectroscopy) and EDS (Energy Dispersive X-Ray Spectroscopy), which provide valuable information about elemental composition and location/distribution.
AnanthaP offers a broad range and large installed base of different microscopy tools and services to match your requirements, ranging from correlative and in situ characterization
to failure analysis.
In addition to providing consultancy on high resolution imaging, our capabilities make us a unique partner that can help you during research, development, and analysis of
failures.
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